Nanotechnology for Surface Imaging - Nanotech TOE

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Atomic force microscopy (AFM) is an imaging technique that allows for image resolutions in the nanometer scale. The novelty of the AFM technique lies in that fact that neither lenses nor radiation is used for imaging. This issue of Nanotech TOE looks into some of the latest innovations that pertain to high-resolution imaging by various industry participants across the globe.The Nanotech TechVision Opportunity Engine (TOE) provides intelligence on technologies, products, processes, applications, and strategic insights on nanotechnology-related innovations and their impact across various industries. Technology focus areas include nanomaterials, nanocoatings, nanohealthcare, nanomedicine, and nanomanufacturing.The

Table of Contents

Nanotechnology for Surface Imaging - Nanotech TOEInnovations in Nanotechnology for Surface ImagingFastScan Enables Real-time MeasurementHigh-vacuum AFMAFM for Large Samples for Quality ControlAutomated AFM-Raman-SNOM SystemStrategic InsightsCompetitive Landscape and IPAnalyst PerspectivesKey PatentsKey PatentsKey Patents (continued)Industry ContactsIndustry Contacts

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