Scope and Research Methodology

• Scope
• Research Methodology

Introduction and Key Findings

• Introduction
• Key Findings

Role of Testing in IC Chip Production Flow

Market and Technology Trends

• Typical Production Flow
• Engineering and Manufacturing Testing

ATE and DFT Technologies

Testing Diagnostic Tools and Software

Noteworthy Future Technologies

• 6.5 Gbps Open Architecture ATE Solution
• ATE Industry's First Universal Slot Open Architecture Solution
• ATE with Advanced IC Reliability Testing Features
• Fully Automated On-Wafer RF Testing
• New ATE Solution with 12.8 Gbps Bit Rate
• Calibration using Robotic Control
• X-Compact:A Compaction Technique for Increasing Semiconductor Chip Testing Requirements
• X-PAND: An Efficient Test Stimulus Compression Technique
• DFT Analyzer Validates DFT Features before Prototyping
• DFT Technology That Cuts ATE Overheads
• Fully Integrated Embedded Test and Diagnostic Solution for 90 nm and Beyond
• Next Generation 1-Pass Test Synthesis

Adoption Factors

Forecasts

Key Contacts

Selected Patents and Glossary

Excellence in Technology Award

Technology Innovation Award

Product Innovation Award

Semiconductor End-Product Market Statistics

Semiconductor Industry Statistics