Emerging Trends in Semiconductor Testing and Semiconductor ATE (Technical Insights)

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Table of Contents

Emerging Trends in Semiconductor Testing and Semiconductor ATE (Technical Insights), Executive SummaryScope and Research MethodologyScopeResearch MethodologyIntroduction and Key FindingsIntroductionKey FindingsEmerging Trends in Semiconductor Testing and Semiconductor ATE (Technical Insights), Trends in Semiconductor Testing TechnologyRole of Testing in IC Chip Production FlowTypical Production FlowEngineering and Manufacturing TestingMarket and Technology TrendsSuppressing Test CostIncreased On-Chip TestingRise of Open ArchitectureModular SystemsTesting in ParallelEmerging Trends in Semiconductor Testing and Semiconductor ATE (Technical Insights), Prominent Emerging TechnologiesATE and DFT Technologies6.5 Gbps Open Architecture ATE SolutionATE Industry's First Universal Slot Open Architecture Solution ATE with Advanced IC Reliability Testing FeaturesFully Automated On-Wafer RF TestingNew ATE Solution with 12.8 Gbps Bit RateCalibration using Robotic ControlX-Compact:A Compaction Technique for Increasing Semiconductor Chip Testing RequirementsX-PAND: An Efficient Test Stimulus Compression TechniqueDFT Analyzer Validates DFT Features before PrototypingDFT Technology That Cuts ATE OverheadsFully Integrated Embedded Test and Diagnostic Solution for 90 nm and BeyondNext Generation 1-Pass Test SynthesisTesting Diagnostic Tools and SoftwareEmbedded SerDes Test (EST) High-Speed I/O Test TechnologyExtremely Low Inductance Power Transmission Module for At-Speed Testing of SOCsIndustry's Fastest and Most Cost-Effective SMU LineZero-Defectivity Capable In-line Data Analysis Solution for Semiconductor Production TestTowards Zero Defectivity in Semiconductor ChipsNoteworthy Future TechnologiesNew IEEE Standard for Testing Carbon NanotubeWireless Test Access Mechanism for Future SOC ChipsComputational Intelligence-Based Testing for Semiconductor Measurement SystemsEmerging Trends in Semiconductor Testing and Semiconductor ATE (Technical Insights), Adoption Factors and ForecastsAdoption FactorsTechnology and Market DriversRestraintsChallengesForecastsStruggles in Open Architecture SystemsComputational Intelligence ATE SystemHigh-end TestersZero Defects Initiative (FlexRay and PAT)Emerging Trends in Semiconductor Testing and Semiconductor ATE (Technical Insights), Key Contacts and Selected PatentsKey ContactsCorporateUniversities/Research InstitutesSelected Patents and GlossaryList of Recent Patents-IList of Recent Patents-IIGlossary of Terms used in Semiconductor TestingEmerging Trends in Semiconductor Testing and Semiconductor ATE (Technical Insights), Frost & Sullivan 2006 Science & Technology AwardsExcellence in Technology AwardAward DescriptionAward RecipientTechnology Innovation AwardAward DescriptionAward RecipientProduct Innovation AwardAward DescriptionAward RecipientEmerging Trends in Semiconductor Testing and Semiconductor ATE (Technical Insights), Decision Support DatabasesSemiconductor End-Product Market StatisticsBusiness PCs Installed Bases in North America from 1999 to 2009Business PCs per Entreprise in North America from 1999 to 2009 Camcorder Units Sales in United States from 1999 to 2009Digital Camera Units Sales in North America from 1999 to 2009Global PCs Installed Bases for the Period of 1996 to 2004Global Handsets Installed Bases from 1996 to 2004Global Handsets Sales from 1996 to 2004Home PCs per Household in North America From 1999 to 2009Number of Telemuters in North America from 1999 to 2009Total PDA Units Sales in United States from 1999 to 2009Total Protable PCs Installed Bases Worldwide from 1996 to 2004Global TV Installed Bases from 1996 to 2004Semiconductor Industry StatisticsGlobal Semiconductor & Semiconductor Equipment Market Value from 1999 to 2006.Number of Semiconductor Plants in United States from 1988 to 2001Global Semiconductor & Semiconductor Equipment Market Value from 1996 to 2006Global Printed Circuit Board Sales from 1998 to 2004




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