Frost Radar in the Industrial Computed Tomography Solutions Industry

Frost Radar in the Industrial Computed Tomography Solutions Industry

A Measurement System to Spark Companies 2 Action (C2A)—Innovation That Fuels New Deal Flow and Growth Pipelines

RELEASE DATE
23-Apr-2019
REGION
North America
Research Code: K36C-01-00-00-00
SKU: TM00583-NA-MR_23079

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$4,950.00

$3,712.50 save 25 %

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Description

CT will evolve as the most important technology for inspecting complex internal geometries and 3-D printed components. CT metrology systems are in a unique position to provide 3-D CT measurement without component configuration. CT scanning can access areas of components normally inaccessible by other metrology techniques. Whether in assembled or pre-assembled states, CT scanning tests products for tolerance assessments, part-to-part comparisons, thickness, and other measurements.

Major opportunities for the CT market are from the automotive segment, aerospace and aviation segment, and electronics segment.

Despite existing benefits, the scanning speeds and high costs of CT scanners hamper equipment adoption among manufacturers. Speed is crucial in manufacturing and will continue to play a critical role in pushing companies to adopt CT scanning systems.

Additionally, despite the potential advantages of CT systems, Frost & Sullivan ongoing research shows that another key challenge is sustaining growth in a market with extreme price sensitivity at all levels.

Of the more than 30 companies in this space, 18 have delivered commendable performance by capitalizing on the positive trends impacting the market. They can be broadly categorized into 3 groups:
Companies that score very high on both growth and innovation, which are well-known industry leaders that have a history of being at the forefront of innovation.
Companies that score high on innovation but delivering lower growth, which appear in the bottom right of the radar and are the brink of witnessing higher growth due to a significant focus on innovation. These include known leaders as well as relatively new market entrants.
The third group of companies includes those implementing some level of innovation, which results in growth but not to the level seen in the other groups.

The classification of CT systems under the scope of this study, based on focal spot size and acceleration voltages, include:
Nano CT: Systems that have X-ray tubes with focal spots less than 1 ?m and are most suited for scanning small objects; acceleration voltages in the range of 50 to 160 kV
Micro CT: Systems that use X-ray tubes with focal spots between 1 and 100 ?m achievable by placing the object as close as possible to the focus; acceleration voltage of 80kV to 450kV
Mini CT: Systems that have X-ray focus from 100 ?m to 1 mm; acceleration voltage from 320 kV to 450 kV
Macro CT: Systems with focal spot size beyond 1 mm; acceleration voltages above 450 kV

The Frost Radar reveals the market positioning of companies in an industry using their Growth and Innovation scores as highlighted in the Frost Radar methodology. The document presents competitive profiles on each of the companies in the Frost Radar based on their strengths, opportunities, and a small discussion on their positioning. Frost & Sullivan analyzes hundreds of companies in the industry and benchmarks them across 10 criteria on the Frost Radar, where the leading companies in the industry are then positioned. Industry leaders on both the Growth and Innovation indices are recognized as best practice recipients.

Author: Mariano Kimbara

Table of Contents

Industry Overview

Industry Overview (continued)

Industry Overview (continued)

The Frost Radar

Frost Radar—Description of Companies Plotted

GE Inspection Technologies (Baker Hughes GE IT)

Carl Zeiss Industrial Metrology, LLC

Wenzel Group GmbH & Co. KG

YXLON International GmbH

Nikon Metrology

North Star Imaging

Diondo GmbH - X-ray systems and services

Werth Messtechnik GmbH

GOM Metrology

Bruker Corporation

RayScan Technologies GmbH

RX Solutions

Rigaku Corporation

Shimadzu Corporation

Nordson

Thermo Scientific

Omron

VJ Technologies

The Last Word—Key Takeaways

Legal Disclaimer

Frost Radar—2 Major Indices, 10 Analytical Ingredients, 1 Platform

Frost Radar—2 Major Indices, 10 Analytical Ingredients, 1 Platform (continued)

Frost Radar—C2A

Related Research
CT will evolve as the most important technology for inspecting complex internal geometries and 3-D printed components. CT metrology systems are in a unique position to provide 3-D CT measurement without component configuration. CT scanning can access areas of components normally inaccessible by other metrology techniques. Whether in assembled or pre-assembled states, CT scanning tests products for tolerance assessments, part-to-part comparisons, thickness, and other measurements. Major opportunities for the CT market are from the automotive segment, aerospace and aviation segment, and electronics segment. Despite existing benefits, the scanning speeds and high costs of CT scanners hamper equipment adoption among manufacturers. Speed is crucial in manufacturing and will continue to play a critical role in pushing companies to adopt CT scanning systems. Additionally, despite the potential advantages of CT systems, Frost & Sullivan ongoing research shows that another key challenge is sustaining growth in a market with extreme price sensitivity at all levels. Of the more than 30 companies in this space, 18 have delivered commendable performance by capitalizing on the positive trends impacting the market. They can be broadly categorized into 3 groups: Companies that score very high on both growth and innovation, which are well-known industry leaders that have a history of being at the forefront of innovation. Companies that score high on innovation but delivering lower growth, which appear in the bottom right of the radar and are the brink of witnessing higher growth due to a significant focus on innovation. These include known leaders as well as relatively new market entrants. The third group of companies includes those implementing some level of innovation, which results in growth but not to the level seen in the other groups. The classification of CT systems under the scope of this study, based on focal spot size and acceleration voltages, include: Nano C
More Information
No Index No
Podcast No
Author Mariano Kimbara
Industries Test and Measurement Instrumentation
WIP Number K36C-01-00-00-00
Is Prebook No
GPS Codes 9426